Semiconductor processing silica soot abrasive slurry method for integrated circuit microelectronics
The invention utilize colloidal silica soot in a semiconductor process for chemical-mechanical planarizing a semiconductor integrated circuit workpiece with a slurry. The particulate abrasive agent colloidal solid sphere fused silica soot provides a beneficial CMP slurry/process for semiconductor de...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | SABIA, ROBERT SELL, ROBERT D UKRAINCZYK, LJERKA STEVENS, HARRIE JAMES |
description | The invention utilize colloidal silica soot in a semiconductor process for chemical-mechanical planarizing a semiconductor integrated circuit workpiece with a slurry. The particulate abrasive agent colloidal solid sphere fused silica soot provides a beneficial CMP slurry/process for semiconductor device manufacturing compared to standard semiconductor CMP slurries with conventional colloidal sol-gel or fumed silica. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW521337BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW521337BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW521337BB3</originalsourceid><addsrcrecordid>eNqFjLEKwkAMQLs4iPoN5gcc9BD3iuJuwbGcubQGrpeSpIJ_bwd3p7e895YV3mlglJImdFEYVZDMuPRgnBkjmIhDfGo0fhNYnlQ_MJC_JEE3F1yceo1OCZAVJ3aYhyqUCV2lMNq6WnQxG21-XFXb66U533Y0Sks2RqRC3jaP42Efwqmuw3_jC3UVP3U</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Semiconductor processing silica soot abrasive slurry method for integrated circuit microelectronics</title><source>esp@cenet</source><creator>SABIA, ROBERT ; SELL, ROBERT D ; UKRAINCZYK, LJERKA ; STEVENS, HARRIE JAMES</creator><creatorcontrib>SABIA, ROBERT ; SELL, ROBERT D ; UKRAINCZYK, LJERKA ; STEVENS, HARRIE JAMES</creatorcontrib><description>The invention utilize colloidal silica soot in a semiconductor process for chemical-mechanical planarizing a semiconductor integrated circuit workpiece with a slurry. The particulate abrasive agent colloidal solid sphere fused silica soot provides a beneficial CMP slurry/process for semiconductor device manufacturing compared to standard semiconductor CMP slurries with conventional colloidal sol-gel or fumed silica.</description><edition>7</edition><language>eng</language><subject>ADHESIVES ; BASIC ELECTRIC ELEMENTS ; CHEMISTRY ; DRESSING OR CONDITIONING OF ABRADING SURFACES ; DYES ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE ; METALLURGY ; MISCELLANEOUS APPLICATIONS OF MATERIALS ; MISCELLANEOUS COMPOSITIONS ; NATURAL RESINS ; PAINTS ; PERFORMING OPERATIONS ; POLISHES ; POLISHING ; POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH ; SEMICONDUCTOR DEVICES ; SKI WAXES ; TRANSPORTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030221&DB=EPODOC&CC=TW&NR=521337B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030221&DB=EPODOC&CC=TW&NR=521337B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SABIA, ROBERT</creatorcontrib><creatorcontrib>SELL, ROBERT D</creatorcontrib><creatorcontrib>UKRAINCZYK, LJERKA</creatorcontrib><creatorcontrib>STEVENS, HARRIE JAMES</creatorcontrib><title>Semiconductor processing silica soot abrasive slurry method for integrated circuit microelectronics</title><description>The invention utilize colloidal silica soot in a semiconductor process for chemical-mechanical planarizing a semiconductor integrated circuit workpiece with a slurry. The particulate abrasive agent colloidal solid sphere fused silica soot provides a beneficial CMP slurry/process for semiconductor device manufacturing compared to standard semiconductor CMP slurries with conventional colloidal sol-gel or fumed silica.</description><subject>ADHESIVES</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMISTRY</subject><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>DYES</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</subject><subject>METALLURGY</subject><subject>MISCELLANEOUS APPLICATIONS OF MATERIALS</subject><subject>MISCELLANEOUS COMPOSITIONS</subject><subject>NATURAL RESINS</subject><subject>PAINTS</subject><subject>PERFORMING OPERATIONS</subject><subject>POLISHES</subject><subject>POLISHING</subject><subject>POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SKI WAXES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqFjLEKwkAMQLs4iPoN5gcc9BD3iuJuwbGcubQGrpeSpIJ_bwd3p7e895YV3mlglJImdFEYVZDMuPRgnBkjmIhDfGo0fhNYnlQ_MJC_JEE3F1yceo1OCZAVJ3aYhyqUCV2lMNq6WnQxG21-XFXb66U533Y0Sks2RqRC3jaP42Efwqmuw3_jC3UVP3U</recordid><startdate>20030221</startdate><enddate>20030221</enddate><creator>SABIA, ROBERT</creator><creator>SELL, ROBERT D</creator><creator>UKRAINCZYK, LJERKA</creator><creator>STEVENS, HARRIE JAMES</creator><scope>EVB</scope></search><sort><creationdate>20030221</creationdate><title>Semiconductor processing silica soot abrasive slurry method for integrated circuit microelectronics</title><author>SABIA, ROBERT ; SELL, ROBERT D ; UKRAINCZYK, LJERKA ; STEVENS, HARRIE JAMES</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW521337BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>ADHESIVES</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMISTRY</topic><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>DYES</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE</topic><topic>METALLURGY</topic><topic>MISCELLANEOUS APPLICATIONS OF MATERIALS</topic><topic>MISCELLANEOUS COMPOSITIONS</topic><topic>NATURAL RESINS</topic><topic>PAINTS</topic><topic>PERFORMING OPERATIONS</topic><topic>POLISHES</topic><topic>POLISHING</topic><topic>POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SKI WAXES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SABIA, ROBERT</creatorcontrib><creatorcontrib>SELL, ROBERT D</creatorcontrib><creatorcontrib>UKRAINCZYK, LJERKA</creatorcontrib><creatorcontrib>STEVENS, HARRIE JAMES</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SABIA, ROBERT</au><au>SELL, ROBERT D</au><au>UKRAINCZYK, LJERKA</au><au>STEVENS, HARRIE JAMES</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Semiconductor processing silica soot abrasive slurry method for integrated circuit microelectronics</title><date>2003-02-21</date><risdate>2003</risdate><abstract>The invention utilize colloidal silica soot in a semiconductor process for chemical-mechanical planarizing a semiconductor integrated circuit workpiece with a slurry. The particulate abrasive agent colloidal solid sphere fused silica soot provides a beneficial CMP slurry/process for semiconductor device manufacturing compared to standard semiconductor CMP slurries with conventional colloidal sol-gel or fumed silica.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_TW521337BB |
source | esp@cenet |
subjects | ADHESIVES BASIC ELECTRIC ELEMENTS CHEMISTRY DRESSING OR CONDITIONING OF ABRADING SURFACES DYES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FORELSEWHERE METALLURGY MISCELLANEOUS APPLICATIONS OF MATERIALS MISCELLANEOUS COMPOSITIONS NATURAL RESINS PAINTS PERFORMING OPERATIONS POLISHES POLISHING POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH SEMICONDUCTOR DEVICES SKI WAXES TRANSPORTING |
title | Semiconductor processing silica soot abrasive slurry method for integrated circuit microelectronics |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T05%3A48%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SABIA,%20ROBERT&rft.date=2003-02-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW521337BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |