Semiconductor processing silica soot abrasive slurry method for integrated circuit microelectronics

The invention utilize colloidal silica soot in a semiconductor process for chemical-mechanical planarizing a semiconductor integrated circuit workpiece with a slurry. The particulate abrasive agent colloidal solid sphere fused silica soot provides a beneficial CMP slurry/process for semiconductor de...

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Bibliographische Detailangaben
Hauptverfasser: SABIA, ROBERT, SELL, ROBERT D, UKRAINCZYK, LJERKA, STEVENS, HARRIE JAMES
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The invention utilize colloidal silica soot in a semiconductor process for chemical-mechanical planarizing a semiconductor integrated circuit workpiece with a slurry. The particulate abrasive agent colloidal solid sphere fused silica soot provides a beneficial CMP slurry/process for semiconductor device manufacturing compared to standard semiconductor CMP slurries with conventional colloidal sol-gel or fumed silica.