Photoresist compositions with cyclic olefin polymers and additives, patterned photoresist structure, and the method of forming the same

Acid-catalyzed positive photoresist compositions which are imageable with 193nm radiation and are developable to form photoresist structures of high resolution and high etch resistance are enabled by the use of a combination of cyclic olefin polymer, photosensitive acid generator and of a saturated...

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Hauptverfasser: VARANASI, PUSHKARA RAO, MEWHERTER, ANN MARIE, LAWSON, MARGARET C, MANISCALCO, JOSEPH F, KHOJASTEH, MAHMOUD M.
Format: Patent
Sprache:eng
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Zusammenfassung:Acid-catalyzed positive photoresist compositions which are imageable with 193nm radiation and are developable to form photoresist structures of high resolution and high etch resistance are enabled by the use of a combination of cyclic olefin polymer, photosensitive acid generator and of a saturated steroid component, a hydrophobic non-steroidal alicyclic component, a hydrophobic non-steroidal multi-a licyclic component containing plural acid labile linking groups, or a bulky hydrophobic additive which is substantially transparent to 193 nm radiation. The cyclic olefin polymers contain (i) cyclic olefin units having polar functional moieties, and (ii) cyclic olefin units having acid labile moieties that inhibit solubility in aqueous alkaline solutions.