Method for cleaning semiconductor device

A method is provided for treating a plurality of semiconductor substrates using the same aqueous SC-1 solution which solution removes and/or inhibits contamination of the semiconductor surfaces by metallic ions present in the solution or on the substrate surface comprising a basic solution containin...

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Bibliographische Detailangaben
Hauptverfasser: COOPER, EMANUEL I, ESTES, SCOTT A, GALE, GLENN W, OKORN-SCHMIDT, HARALD F., JAGANNATHAN, RANGARAJAN
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method is provided for treating a plurality of semiconductor substrates using the same aqueous SC-1 solution which solution removes and/or inhibits contamination of the semiconductor surfaces by metallic ions present in the solution or on the substrate surface comprising a basic solution containing hydrogen peroxide and an oxidation-resistant chelating additive such as CDTA in an amount effective to provide the desired treatment results. The SC-1 solution may be the conventional 5:1:1 (water: NH4OH:H2O2) solution or a dilute solution such as a 5:x:1 to 200:x:1 solution wherein x is 0.025 to 2.