Low pressure and low power Cl2/HCl process for sub-micron metal etching
A process for forming a pattern on an aluminum metal coating layer, which comprises the following steps: mounting an aluminum metal coating layer in an etching chamber; generating a plasma from Cl2, HCl and inert gas by using electrodes located above and below the aluminum metal coating layer and se...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | A process for forming a pattern on an aluminum metal coating layer, which comprises the following steps: mounting an aluminum metal coating layer in an etching chamber; generating a plasma from Cl2, HCl and inert gas by using electrodes located above and below the aluminum metal coating layer and separately applied with power, in which each of the electrodes is applied with a power lower than 350 watts, and the pressure in the etching chamber is less than 15 mTorr; and etching the aluminum metal coating layer with the ions and radicals formed in the plasma. |
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