Test socket
The present disclosure relates to a test socket, and more particularly, to a test socket for electrically connecting a device to be tested having a plurality of terminals to a test board of a test apparatus. The test socket includes a housing mounted above the test board and in which a connector for...
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| Hauptverfasser: | , , , |
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | The present disclosure relates to a test socket, and more particularly, to a test socket for electrically connecting a device to be tested having a plurality of terminals to a test board of a test apparatus. The test socket includes a housing mounted above the test board and in which a connector for test is arranged, a cover coupled to the housing to be movable in a vertical direction, operably connected to the housing and the cover, and moving in conjunction with a movement of the cover, between a press position wherein the device to be tested is pressed against a connector for test and a release position where the device to be tested is releasable from the connector for test latch device, and a heating device installed on the latch device and configured to increase the temperature of a device to be tested at the press position by contacting the device to be tested. |
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