Method for polish rate control

A polishing method includes: receiving a semiconductor substrate onto a polishing head over a polishing pad that comprises a first region and a second region, wherein the first region comprises a first set of properties related to a first pad surface pattern, the first set of properties corresponds...

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Bibliographische Detailangaben
Hauptverfasser: HSIAO, HAU-YI, CHEN, SHENGAU, WU, KUO-MING
Format: Patent
Sprache:chi ; eng
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