Method for forming an patterned insulating layer and semiconductor device

The present invention provides a method for forming an insulating film pattern, comprising the steps of: providing a substrate including two or more different types dielectric film areas; selectively forming a barrier film on the substrate so as to include an a first area in which a barrier film is...

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Hauptverfasser: KIM, JUN-YOUNG, KIM, HWAN-SOO, BOK, CHEOL-KYU, LEE, JAE-WOO, KIM, PIL-SOO, SIM, JANG-KEUN, LEE, HAN-JIN, YEO, SO-JEONG, LEE, GYEONG-A
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creator KIM, JUN-YOUNG
KIM, HWAN-SOO
BOK, CHEOL-KYU
LEE, JAE-WOO
KIM, PIL-SOO
SIM, JANG-KEUN
LEE, HAN-JIN
YEO, SO-JEONG
LEE, GYEONG-A
description The present invention provides a method for forming an insulating film pattern, comprising the steps of: providing a substrate including two or more different types dielectric film areas; selectively forming a barrier film on the substrate so as to include an a first area in which a barrier film is formed and a second area in which a barrier film is not formed or a barrier film is relatively less formed; selectively forming an insulating film on the second area; and etching a portion of the upper part of the insulating film.
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language chi ; eng
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subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title Method for forming an patterned insulating layer and semiconductor device
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