Dielectric-on-dielectric selective deposition using aniline passivation

A method includes forming a conductive material on a first dielectric layer, exposing the conductive material to aniline to produce a passivated surface of the conductive material, and after exposing the conductive material to aniline, forming a second dielectric layer on the first dielectric layer...

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Bibliographische Detailangaben
Hauptverfasser: HUANG, JAMES, WONG, KEITH T, YIEH, ELLIE Y, KUMMEL, ANDREW C, NEMANI, SRINIVAS D, CHO, YUNIL
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A method includes forming a conductive material on a first dielectric layer, exposing the conductive material to aniline to produce a passivated surface of the conductive material, and after exposing the conductive material to aniline, forming a second dielectric layer on the first dielectric layer using a deposition process. The deposition process is a water-free and plasma-free deposition process, and the second dielectric layer does not form on the passivated surface of the conductive material.