Probe pin, probe card including probe pin and manufacturing method thereof
According to the present invention, the flexibility of a probe pin is adjusted by providing a vertical slit and/or a horizontal slit, thereby facilitating elastic deformation. In addition, according to the present invention, the sectional area of the probe pin is adjusted, thereby improving high-fre...
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| Hauptverfasser: | , , , |
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | According to the present invention, the flexibility of a probe pin is adjusted by providing a vertical slit and/or a horizontal slit, thereby facilitating elastic deformation. In addition, according to the present invention, the sectional area of the probe pin is adjusted, thereby improving high-frequency signal characteristics thereof. In addition, according to the present invention, a probe pin can be easily inserted into upper and lower plates by using multiple spacing bodies which are spaced apart by a vertical slit and/or a horizontal slit, and the inserted probe pin is prevented from detaching. |
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