System for testing semiconductor device

A system, for testing a plurality of semiconductor devices, includes a pressing apparatus, a carrying apparatus and an abutting apparatus. The pressing apparatus includes a cover and a seat. The cover and the seat constitute a test chamber and a sealed auxiliary chamber. The carrying apparatus is pl...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TOH, CHIH-KANG, CHEN, CHIH-MING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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