Fluid supply mechanism and fluid supply method

A fluid supply mechanism 100 repeatedly supplies and stops fluid to a chamber CH. The fluid supply mechanism 100 includes: a fluid supply path L1 that communicates with the chamber 100; a tank T which is disposed on the fluid supply path L1 and into which fluid is introduced; and a downstream valve...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NISHIWAKI, KEISUKE, YADA, HIDETAKA
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator NISHIWAKI, KEISUKE
YADA, HIDETAKA
description A fluid supply mechanism 100 repeatedly supplies and stops fluid to a chamber CH. The fluid supply mechanism 100 includes: a fluid supply path L1 that communicates with the chamber 100; a tank T which is disposed on the fluid supply path L1 and into which fluid is introduced; and a downstream valve Vd that is disposed downstream of the tank T in the fluid supply path, and changes the internal volume through deformation.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW202415803A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW202415803A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW202415803A3</originalsourceid><addsrcrecordid>eNrjZNBzyynNTFEoLi0oyKlUyE1NzkjMyyzOVUjMS1FIQ5UqychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8SHhRgZGJoamFgbGjsbEqAEABzwqxg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Fluid supply mechanism and fluid supply method</title><source>esp@cenet</source><creator>NISHIWAKI, KEISUKE ; YADA, HIDETAKA</creator><creatorcontrib>NISHIWAKI, KEISUKE ; YADA, HIDETAKA</creatorcontrib><description>A fluid supply mechanism 100 repeatedly supplies and stops fluid to a chamber CH. The fluid supply mechanism 100 includes: a fluid supply path L1 that communicates with the chamber 100; a tank T which is disposed on the fluid supply path L1 and into which fluid is introduced; and a downstream valve Vd that is disposed downstream of the tank T in the fluid supply path, and changes the internal volume through deformation.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240416&amp;DB=EPODOC&amp;CC=TW&amp;NR=202415803A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240416&amp;DB=EPODOC&amp;CC=TW&amp;NR=202415803A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NISHIWAKI, KEISUKE</creatorcontrib><creatorcontrib>YADA, HIDETAKA</creatorcontrib><title>Fluid supply mechanism and fluid supply method</title><description>A fluid supply mechanism 100 repeatedly supplies and stops fluid to a chamber CH. The fluid supply mechanism 100 includes: a fluid supply path L1 that communicates with the chamber 100; a tank T which is disposed on the fluid supply path L1 and into which fluid is introduced; and a downstream valve Vd that is disposed downstream of the tank T in the fluid supply path, and changes the internal volume through deformation.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBzyynNTFEoLi0oyKlUyE1NzkjMyyzOVUjMS1FIQ5UqychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8SHhRgZGJoamFgbGjsbEqAEABzwqxg</recordid><startdate>20240416</startdate><enddate>20240416</enddate><creator>NISHIWAKI, KEISUKE</creator><creator>YADA, HIDETAKA</creator><scope>EVB</scope></search><sort><creationdate>20240416</creationdate><title>Fluid supply mechanism and fluid supply method</title><author>NISHIWAKI, KEISUKE ; YADA, HIDETAKA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW202415803A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>NISHIWAKI, KEISUKE</creatorcontrib><creatorcontrib>YADA, HIDETAKA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NISHIWAKI, KEISUKE</au><au>YADA, HIDETAKA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Fluid supply mechanism and fluid supply method</title><date>2024-04-16</date><risdate>2024</risdate><abstract>A fluid supply mechanism 100 repeatedly supplies and stops fluid to a chamber CH. The fluid supply mechanism 100 includes: a fluid supply path L1 that communicates with the chamber 100; a tank T which is disposed on the fluid supply path L1 and into which fluid is introduced; and a downstream valve Vd that is disposed downstream of the tank T in the fluid supply path, and changes the internal volume through deformation.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_TW202415803A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title Fluid supply mechanism and fluid supply method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T09%3A50%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NISHIWAKI,%20KEISUKE&rft.date=2024-04-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW202415803A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true