Test-hand for handler of electronic component being dedicated for selectively gripping an electronic component or an adapter on which the electronic component is mounted

Test-hand for handler of electronic component being dedicated for selectively gripping an electronic component or an adapter on which the electronic component is mounted

The present invention relates to a test hand for an electronic component handler and an electronic component handler. According to the present invention, the test hand that electrically connects the electronic component to a tester has a replaceable gripping tip, so that it can be dedicated for sele...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NA, YUN-SUNG, CHO, YOUNG-HWAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
DISPOSAL OF SOLID WASTE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PERFORMING OPERATIONS
PHYSICS
RECLAMATION OF CONTAMINED SOIL SOIL
TESTING
TRANSPORTING
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Beschreibung
Zusammenfassung:The present invention relates to a test hand for an electronic component handler and an electronic component handler. According to the present invention, the test hand that electrically connects the electronic component to a tester has a replaceable gripping tip, so that it can be dedicated for selectively gripping the electronic component or an adapter on which the electronic component is mounted. Therefore, various types of electronic components can be processed. The test hand for an electronic component handler includes a gripper, a pusher, an opener, an advancing and retracting device, a vertical mover and a horizontal mover. The gripper includes a pair of gripping rods, a driving source and a pair of gripping tips.