High modulus carbon doped silicon oxide film for mold stack scaling solutions in advanced memory applications

Provided are reduced temperature plasma enhanced chemical vapor deposition processes for producing high modulus oxide thin films on a substrate. The substrate temperature for deposition of the oxide thin film is less than about 700 DEG C.

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Hauptverfasser: SUBRAMONIUM, PRAMOD, HAMMA, SOUMANA, BANERJI, ANANDA K, SAMANTARAY, MALAY MILAN, HAYNES, KATHERINE ELIZABETH, REDDY, KAPU SIRISH
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creator SUBRAMONIUM, PRAMOD
HAMMA, SOUMANA
BANERJI, ANANDA K
SAMANTARAY, MALAY MILAN
HAYNES, KATHERINE ELIZABETH
REDDY, KAPU SIRISH
description Provided are reduced temperature plasma enhanced chemical vapor deposition processes for producing high modulus oxide thin films on a substrate. The substrate temperature for deposition of the oxide thin film is less than about 700 DEG C.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW202411455A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW202411455A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW202411455A3</originalsourceid><addsrcrecordid>eNqNjEEKwjAQRbtxIeodxgMItrYHEFF6gILLMibTOphkQqcRvb1BPICrz-e9_5eFb3m8gxebXFIwON0kgJVIFpQdm9zkxZZgYOdhkCm7LrMZzQPUoOMwgopLM0tQ4ABonxhM3nvyMr0BY8w_-OXrYjGgU9r8clVsL-fu1O4oSk8a0VCgue-u1b6qy7JumuPhH-cDgl9Cmw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>High modulus carbon doped silicon oxide film for mold stack scaling solutions in advanced memory applications</title><source>esp@cenet</source><creator>SUBRAMONIUM, PRAMOD ; HAMMA, SOUMANA ; BANERJI, ANANDA K ; SAMANTARAY, MALAY MILAN ; HAYNES, KATHERINE ELIZABETH ; REDDY, KAPU SIRISH</creator><creatorcontrib>SUBRAMONIUM, PRAMOD ; HAMMA, SOUMANA ; BANERJI, ANANDA K ; SAMANTARAY, MALAY MILAN ; HAYNES, KATHERINE ELIZABETH ; REDDY, KAPU SIRISH</creatorcontrib><description>Provided are reduced temperature plasma enhanced chemical vapor deposition processes for producing high modulus oxide thin films on a substrate. The substrate temperature for deposition of the oxide thin film is less than about 700 DEG C.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240316&amp;DB=EPODOC&amp;CC=TW&amp;NR=202411455A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240316&amp;DB=EPODOC&amp;CC=TW&amp;NR=202411455A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SUBRAMONIUM, PRAMOD</creatorcontrib><creatorcontrib>HAMMA, SOUMANA</creatorcontrib><creatorcontrib>BANERJI, ANANDA K</creatorcontrib><creatorcontrib>SAMANTARAY, MALAY MILAN</creatorcontrib><creatorcontrib>HAYNES, KATHERINE ELIZABETH</creatorcontrib><creatorcontrib>REDDY, KAPU SIRISH</creatorcontrib><title>High modulus carbon doped silicon oxide film for mold stack scaling solutions in advanced memory applications</title><description>Provided are reduced temperature plasma enhanced chemical vapor deposition processes for producing high modulus oxide thin films on a substrate. The substrate temperature for deposition of the oxide thin film is less than about 700 DEG C.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjEEKwjAQRbtxIeodxgMItrYHEFF6gILLMibTOphkQqcRvb1BPICrz-e9_5eFb3m8gxebXFIwON0kgJVIFpQdm9zkxZZgYOdhkCm7LrMZzQPUoOMwgopLM0tQ4ABonxhM3nvyMr0BY8w_-OXrYjGgU9r8clVsL-fu1O4oSk8a0VCgue-u1b6qy7JumuPhH-cDgl9Cmw</recordid><startdate>20240316</startdate><enddate>20240316</enddate><creator>SUBRAMONIUM, PRAMOD</creator><creator>HAMMA, SOUMANA</creator><creator>BANERJI, ANANDA K</creator><creator>SAMANTARAY, MALAY MILAN</creator><creator>HAYNES, KATHERINE ELIZABETH</creator><creator>REDDY, KAPU SIRISH</creator><scope>EVB</scope></search><sort><creationdate>20240316</creationdate><title>High modulus carbon doped silicon oxide film for mold stack scaling solutions in advanced memory applications</title><author>SUBRAMONIUM, PRAMOD ; HAMMA, SOUMANA ; BANERJI, ANANDA K ; SAMANTARAY, MALAY MILAN ; HAYNES, KATHERINE ELIZABETH ; REDDY, KAPU SIRISH</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW202411455A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>SUBRAMONIUM, PRAMOD</creatorcontrib><creatorcontrib>HAMMA, SOUMANA</creatorcontrib><creatorcontrib>BANERJI, ANANDA K</creatorcontrib><creatorcontrib>SAMANTARAY, MALAY MILAN</creatorcontrib><creatorcontrib>HAYNES, KATHERINE ELIZABETH</creatorcontrib><creatorcontrib>REDDY, KAPU SIRISH</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SUBRAMONIUM, PRAMOD</au><au>HAMMA, SOUMANA</au><au>BANERJI, ANANDA K</au><au>SAMANTARAY, MALAY MILAN</au><au>HAYNES, KATHERINE ELIZABETH</au><au>REDDY, KAPU SIRISH</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>High modulus carbon doped silicon oxide film for mold stack scaling solutions in advanced memory applications</title><date>2024-03-16</date><risdate>2024</risdate><abstract>Provided are reduced temperature plasma enhanced chemical vapor deposition processes for producing high modulus oxide thin films on a substrate. The substrate temperature for deposition of the oxide thin film is less than about 700 DEG C.</abstract><oa>free_for_read</oa></addata></record>
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language chi ; eng
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subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title High modulus carbon doped silicon oxide film for mold stack scaling solutions in advanced memory applications
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T12%3A05%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SUBRAMONIUM,%20PRAMOD&rft.date=2024-03-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW202411455A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true