Compliant probes including dual independently operable probe contact elements including at least one spring

Compliant probes including dual independently operable probe contact elements including at least one spring

Probe structures including at least one flat tensional spring and movable frame structures or barrels and plungers and/or pairs of joined probe contact elements with independently compressible tips.

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Bibliographische Detailangaben
Hauptverfasser: VEERAMANI, ARUN S, WU, MING TING, SMALLEY, GARRET R
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Probe structures including at least one flat tensional spring and movable frame structures or barrels and plungers and/or pairs of joined probe contact elements with independently compressible tips.