Defect verification method, detection method for semiconductor chip carrier and AOI equipment

The present disclosure provides a defect verification method, a detection method for a semiconductor chip carrier and an AOI device, wherein the verification method comprises: scanning the carrier in defect detection to obtain a scanned image of the carrier, and identifying a defect in the scanned i...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HU, BING-FENG, KAPLAN, VAL, TZHORI, AMIR, FLIESWASSER, RONI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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