Method for identifying abnormal distribution and electronic apparatus

A method for identifying abnormal distribution and an electronic apparatus are provided. A probability plot is generated based on the test data of wafer acceptance test (WAT). The test data includes multiple test values corresponding to a test item, and failure wafer count corresponding to each test...

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Hauptverfasser:	LU, CHIEN-HUI, CHE, SHYNG-YEUAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PHYSICS SEMICONDUCTOR DEVICES
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creator	LU, CHIEN-HUI CHE, SHYNG-YEUAN
description	A method for identifying abnormal distribution and an electronic apparatus are provided. A probability plot is generated based on the test data of wafer acceptance test (WAT). The test data includes multiple test values corresponding to a test item, and failure wafer count corresponding to each test value. A feature vector is obtained from the probability plot. A rectified function is used to filter the feature vector and a filtered vector is obtained. A kurtosis management coefficient is calculated based on a smoothing matrix, the filtered vector and its transposed matrix to determine whether there is an abnormal distribution based on the kurtosis management coefficient.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW202405966A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW202405966A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW202405966A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAsDqL-w_kBQqlacBSpuLgVHMs1uehBvAvJdfDvXfwAp7e8pevvZC8NELUABxLj-GF5Ak6i5Y0JAlcrPM3GKoASgBJ5KyrsAXPGgjbXtVtETJU2P1due-2Hy21HWUeqGT0J2Tg82qY9NMdT1533_5wvRzA0Hg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for identifying abnormal distribution and electronic apparatus</title><source>esp@cenet</source><creator>LU, CHIEN-HUI ; CHE, SHYNG-YEUAN</creator><creatorcontrib>LU, CHIEN-HUI ; CHE, SHYNG-YEUAN</creatorcontrib><description>A method for identifying abnormal distribution and an electronic apparatus are provided. A probability plot is generated based on the test data of wafer acceptance test (WAT). The test data includes multiple test values corresponding to a test item, and failure wafer count corresponding to each test value. A feature vector is obtained from the probability plot. A rectified function is used to filter the feature vector and a filtered vector is obtained. A kurtosis management coefficient is calculated based on a smoothing matrix, the filtered vector and its transposed matrix to determine whether there is an abnormal distribution based on the kurtosis management coefficient.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240201&DB=EPODOC&CC=TW&NR=202405966A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240201&DB=EPODOC&CC=TW&NR=202405966A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LU, CHIEN-HUI</creatorcontrib><creatorcontrib>CHE, SHYNG-YEUAN</creatorcontrib><title>Method for identifying abnormal distribution and electronic apparatus</title><description>A method for identifying abnormal distribution and an electronic apparatus are provided. A probability plot is generated based on the test data of wafer acceptance test (WAT). The test data includes multiple test values corresponding to a test item, and failure wafer count corresponding to each test value. A feature vector is obtained from the probability plot. A rectified function is used to filter the feature vector and a filtered vector is obtained. A kurtosis management coefficient is calculated based on a smoothing matrix, the filtered vector and its transposed matrix to determine whether there is an abnormal distribution based on the kurtosis management coefficient.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAsDqL-w_kBQqlacBSpuLgVHMs1uehBvAvJdfDvXfwAp7e8pevvZC8NELUABxLj-GF5Ak6i5Y0JAlcrPM3GKoASgBJ5KyrsAXPGgjbXtVtETJU2P1due-2Hy21HWUeqGT0J2Tg82qY9NMdT1533_5wvRzA0Hg</recordid><startdate>20240201</startdate><enddate>20240201</enddate><creator>LU, CHIEN-HUI</creator><creator>CHE, SHYNG-YEUAN</creator><scope>EVB</scope></search><sort><creationdate>20240201</creationdate><title>Method for identifying abnormal distribution and electronic apparatus</title><author>LU, CHIEN-HUI ; CHE, SHYNG-YEUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW202405966A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>LU, CHIEN-HUI</creatorcontrib><creatorcontrib>CHE, SHYNG-YEUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LU, CHIEN-HUI</au><au>CHE, SHYNG-YEUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for identifying abnormal distribution and electronic apparatus</title><date>2024-02-01</date><risdate>2024</risdate><abstract>A method for identifying abnormal distribution and an electronic apparatus are provided. A probability plot is generated based on the test data of wafer acceptance test (WAT). The test data includes multiple test values corresponding to a test item, and failure wafer count corresponding to each test value. A feature vector is obtained from the probability plot. A rectified function is used to filter the feature vector and a filtered vector is obtained. A kurtosis management coefficient is calculated based on a smoothing matrix, the filtered vector and its transposed matrix to determine whether there is an abnormal distribution based on the kurtosis management coefficient.</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PHYSICS SEMICONDUCTOR DEVICES
title	Method for identifying abnormal distribution and electronic apparatus
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