Facility abnormality determination device, abnormality determination system, abnormality determination method, control method for abnormality determination system, and abnormality determination program

According to the present invention, an abnormality determination device determines abnormalities in a facility in which a sequence control is implemented for conducting a plurality of events in order. The present device calculates an event interval between a first event and a second event, and an ev...

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Bibliographische Detailangaben
Hauptverfasser:	KUBO, HIROYOSHI, AOTA, HIROMI, FUKADA, WATARU, NISHIMURA, KOJI, KIZU, TETSUYA, URAKATA, YUICHIRO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	According to the present invention, an abnormality determination device determines abnormalities in a facility in which a sequence control is implemented for conducting a plurality of events in order. The present device calculates an event interval between a first event and a second event, and an evaluation index of the similarity of data to be analyzed including at least one process data with respect to normal data. The evaluation index is compared with a preset threshold, and thus whether the facility is abnormal is determined.