Evaluation method, evaluation device and training method for PCB defect detection model

The present disclosure provides an evaluation method, an evaluation device and a training method of a PCB defect detection model, wherein the evaluation method comprising: pre-establishing a test image set, comprising a plurality of test images with defect category labels; inputting a plurality of test images into a defect detection model to be evaluated to obtain a defect prediction results corresponding to the test images, wherein the defect prediction result comprises a defect type and corresponding probability value; classifying the defect prediction results according to the defect types in the obtained defect prediction results; outputting and displaying test images predicted to be the same defect type according to the classification result, wherein the defect category label of each test image and the probability value in the corresponding defect prediction result are configured to be viewable; based on the defect category labels and classification results of the test images, evaluating the ability of th