Substrate processing method, substrate processing apparatus, and program

To provide a technique capable of selectively forming a film onto a desired front surface with high accuracy. A substrate processing method includes: a step of providing a substrate in which a conductive film and an insulation film are exposed to a front surface; a step of selectively forming an oxi...

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Bibliographische Detailangaben
Hauptverfasser: KAWASAKI, FUMIO, HIROSE, YOSHIRO, NAKATANI, KIMIHIKO, NAGATA, KEISUKE, OTSUKA, YASUNORI, HASHIMOTO, YOSHITOMO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:To provide a technique capable of selectively forming a film onto a desired front surface with high accuracy. A substrate processing method includes: a step of providing a substrate in which a conductive film and an insulation film are exposed to a front surface; a step of selectively forming an oxidant onto the front surface of the insulation film from the conductive film and the insulation film by supplying a material without halogen, the oxidant, and a catalyst to the substrate under an atmosphere of a non-plasma.