Non-halide oxygen-free organometallic precursors for ALD/CVD of metallization
Methods for depositing a film using a non-halide oxygen-free organometallic precursors are disclosed. The method includes forming the film on a substrate surface by exposing the surface to the precursor and a reducing agent, the precursor has a general formula (I): M-L1L2, wherein M is a metal, L1 i...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Methods for depositing a film using a non-halide oxygen-free organometallic precursors are disclosed. The method includes forming the film on a substrate surface by exposing the surface to the precursor and a reducing agent, the precursor has a general formula (I): M-L1L2, wherein M is a metal, L1 is a first aromatic ligand having a hapticity selected from n3, n5, or n6, L2 is a ligand having a hapticity selected from of n3, n4, n5, n6, n7, n8, n9 or n10. The first aromatic ligand, L1, may include a structure according to formula (II), wherein each of R1, R2, R3, R4, R5 and R6 is independently selected from a group consisting of H, methyl, ethyl, n-propyl, isopropyl, n-butyl and iso-butyl. The ligand, L2, can be independently selected from a group consisting of hexa-1,3,5-triene, 2-methylene-1,3-propanediyl, 1,2-diethenylcyclohex-1-ene, cyclooctatetraene, cyclooctatetraenide anion, styrene, o-quinodimethane, phenyl thiocyanate, phenyl isothiocyanate, (3-methylphenyl)-methylene and derivatives thereof. |
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