Radiation-sensitive resin composition and pattern formation method

Provided are a radiation-sensitive resin composition capable of forming a resist film with excellent sensitivity, LWR performance, water repellency, and suppression of development flaws, and having good storage stability; and a pattern forming method. A radiation-sensitive resin composition comprisi...

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Bibliographische Detailangaben
Hauptverfasser: FURUKAWA, TSUYOSHI, NEMOTO, RYUICHI, FURUKAWA, TAIICHI, INAMI, HAJIME
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:Provided are a radiation-sensitive resin composition capable of forming a resist film with excellent sensitivity, LWR performance, water repellency, and suppression of development flaws, and having good storage stability; and a pattern forming method. A radiation-sensitive resin composition comprising a polymer comprising structural units (I) represented by formula (1) and structural units differing from said structural units (I); an onium salt represented by formula (i); and a solvent. (In formula (1), RK1 is a hydrogen atom, a fluorine atom, a methyl group, or trifluoromethyl group. L1 is a 1-5 carbon alkanediyl group. Rf1 is a 2-10 carbon fluorinated hydrocarbon group with 5-7 fluorine atoms.) (In formula (i), Ra1 is a substituted or unsubstituted 1-40 carbon monovalent organic group in which the atom adjacent to the sulfur atom is not bound to a fluorine atom or fluorinated hydrocarbon group. X+ is a monovalent onium cation.).