Device and method for passive component inspection

Device and method for passive component inspection

A device for passive component inspection is disclosed, which includes a first light source, a second light source and an imaging apparatus. The first light source is configured to project first light toward a first side face of a passive component in an inspection area. The light source is configur...

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Hauptverfasser: CHEN, HUANGI, LEE, SHANG-HSUEH, GONG, MINANG
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator CHEN, HUANGI
LEE, SHANG-HSUEH
GONG, MINANG
description A device for passive component inspection is disclosed, which includes a first light source, a second light source and an imaging apparatus. The first light source is configured to project first light toward a first side face of a passive component in an inspection area. The light source is configured to project second light toward a second side face of the passive component in the inspection area. The imaging apparatus is configured to capture a top-view image of the passive component in the inspection area, so as to determine whether the passive component has any lateral crack defect from the top-view image.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Device and method for passive component inspection
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