Device and method for passive component inspection
A device for passive component inspection is disclosed, which includes a first light source, a second light source and an imaging apparatus. The first light source is configured to project first light toward a first side face of a passive component in an inspection area. The light source is configur...
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | A device for passive component inspection is disclosed, which includes a first light source, a second light source and an imaging apparatus. The first light source is configured to project first light toward a first side face of a passive component in an inspection area. The light source is configured to project second light toward a second side face of the passive component in the inspection area. The imaging apparatus is configured to capture a top-view image of the passive component in the inspection area, so as to determine whether the passive component has any lateral crack defect from the top-view image. |
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