Testing method and testing system with dynamically adjusted test items

Disclosed is a testing method and testing system with dynamically adjusted test items. The testing system includes a test server, an electronic device under test and a test fixture to execute the testing method, including: an information collecting step, a test plan sending step, and a test item exe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG, LING-FENG, LU, KUING, LIU, WEI-JUNG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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