Testing method and testing system with dynamically adjusted test items

Disclosed is a testing method and testing system with dynamically adjusted test items. The testing system includes a test server, an electronic device under test and a test fixture to execute the testing method, including: an information collecting step, a test plan sending step, and a test item exe...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG, LING-FENG, LU, KUING, LIU, WEI-JUNG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:Disclosed is a testing method and testing system with dynamically adjusted test items. The testing system includes a test server, an electronic device under test and a test fixture to execute the testing method, including: an information collecting step, a test plan sending step, and a test item execution step. In the information collecting step, an agent program installed on the electronic device under test collects information of the electronic device under test and the test fixture. In the test plan sending step, the test server sends a test plan to the agent program according to the information of the electronic device under test and the test fixture. In the test item execution step, the agent program sequentially requests at least one test program and at least one test parameter from the test server according to the test plan, executes each test item to obtain a test result, and sends the test result to the test server.