Film inspection apparatus, film inspection method and program wherein detection of defects generated in a film can be easily performed without manual monitoring

Detection of defects generated in a film can be easily performed without manual monitoring. In a film inspection device for optically inspecting defects generated in films in an overlaid state, light is irradiated from a light source to an inspection area of a film (step S1), a camera (optical senso...

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Bibliographische Detailangaben
Hauptverfasser:	KAWAMURA, YOSUKE, HATAZAWA, SHOTA, SAGAWA, SHOGO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Detection of defects generated in a film can be easily performed without manual monitoring. In a film inspection device for optically inspecting defects generated in films in an overlaid state, light is irradiated from a light source to an inspection area of a film (step S1), a camera (optical sensor) photographs the inspection area of the film to detect stray lights in lights reflected in the inspection area (step S2), and a control unit performs data processing on an output signal of the camera to detect defects (step S5).