Inspection tips and manufacturing method for the same
Provided is a testing chip in which uneven color development is significantly suppressed and that makes simple quantification possible regardless of the amount of test liquid that is introduced. This testing chip is characterized by comprising a first layer on one surface on the front of the testing...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | Provided is a testing chip in which uneven color development is significantly suppressed and that makes simple quantification possible regardless of the amount of test liquid that is introduced. This testing chip is characterized by comprising a first layer on one surface on the front of the testing chip and a second layer on the other surface on the back of the testing chip, and in that: the first layer or second layer has a liquid acceptance part A; the first layer at least has a detection confirmation part B; the second layer at least has a liquid distribution part D adjacent to the detection confirmation part B and a liquid flow path E connected to the liquid distribution part D; when the test liquid is dripped onto the liquid acceptance part A, the test liquid is distributed in a prescribed order by the capillary effect and reaches the detection confirmation part B; and at least the material M surfaces of the surface of the first layer and surface of the second layer other than the liquid acceptance part |
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