Reagents to remove oxygen from metal oxyhalide precursors in thin film deposition processes

A process for gas phase deposition of a metal or metal nitride film on a surface substrate comprises: reacting a metal-oxo or metal oxyhalide precursor with an oxophilic reagent in a reactor containing the substrate to deoxygenate the metal-oxo or metal oxyhalide precursor, and forming the metal or...

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Bibliographische Detailangaben
Hauptverfasser: PALLEM, VENKATESWARA R, LI, FENG, BLASCO, NICOLAS, GAO, ZHENG-NING, ARTEAGA MULLER, ROCIO ALEJANDRA, LIU, YUMIN, GIRARD, JEAN-MARC
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A process for gas phase deposition of a metal or metal nitride film on a surface substrate comprises: reacting a metal-oxo or metal oxyhalide precursor with an oxophilic reagent in a reactor containing the substrate to deoxygenate the metal-oxo or metal oxyhalide precursor, and forming the metal or metal nitride film on the substrate through a vapor deposition process. The substrate is exposed to the metal oxyhalide precursor and the oxophilic reagent simultaneously or sequentially. The substrate is exposed to a reducing agent sequentially after deoxygenation.