Transistor and method of forming the same

A transistor and a method of forming the same are provided. In an embodiment, the method includes: depositing a protective layer on a source/drain region and a gate mask, the gate mask disposed on a gate structure, the gate structure disposed on a channel region of a substrate, the channel region ad...

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Bibliographische Detailangaben
Hauptverfasser: WU, YANGNG, CHEN, YUN-HUA, HSIEH, WEN-KUO, LIN, HUAN-JUST
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A transistor and a method of forming the same are provided. In an embodiment, the method includes: depositing a protective layer on a source/drain region and a gate mask, the gate mask disposed on a gate structure, the gate structure disposed on a channel region of a substrate, the channel region adjoining the source/drain region; etching an opening through the protective layer, the opening exposing the source/drain region; depositing a metal in the opening and on the protective layer; annealing the metal to form a metal-semiconductor alloy region on the source/drain region; and removing residue of the metal from the opening with a cleaning process, the protective layer covering the gate mask during the cleaning process.