Test target defect identification and evaluation for assessing quality of component carrier structure

Test target defect identification and evaluation for assessing quality of component carrier structure

Apparatus (100) for testing quality of a component carrier structure (102), wherein the apparatus (100) comprises a material removal unit (112) configured for removing material of the component carrier structure (102) for exposing a plane in an interior of the component carrier structure (102), a de...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SCHWAIGER, JURGEN, SPITZER, ROBERT, SCHUTTING, GUNTER, PACHER, GERNOT, TITJUNG, FLORIAN, GRUBER, IRENE
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SCHWAIGER, JURGEN
SPITZER, ROBERT
SCHUTTING, GUNTER
PACHER, GERNOT
TITJUNG, FLORIAN
GRUBER, IRENE
description Apparatus (100) for testing quality of a component carrier structure (102), wherein the apparatus (100) comprises a material removal unit (112) configured for removing material of the component carrier structure (102) for exposing a plane in an interior of the component carrier structure (102), a detection unit (162) configured for detecting component carrier structure specific data (in particular image data) of the exposed plane of the component carrier structure (102), a determining unit (114) configured for determining at least one pre-defined test target (116) of the component carrier structure (102) at the exposed plane based on the component carrier structure specific data, and an evaluation unit (118) configured for identifying and evaluating at least one defect of the at least one determined test target (116) for assessing quality of the component carrier structure (102).
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW202232118A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW202232118A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW202232118A3</originalsourceid><addsrcrecordid>eNqNi0EKwjAQRbtxIeodxgMINt24FVE8QMFlGdKfMlCTmJkI3l5BD-Dq8eC9ZYMeamRcJhiNCPBGMiKaBPFskiJxHAlPnutXQyrEqlCVONGj8iz2ohTIp3tO8bOS51IEhdRK9VYL1s0i8KzY_Lhqtpdzf7rukNMAzewRYUN_c3vnOte2h2P3T_MGollAUg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test target defect identification and evaluation for assessing quality of component carrier structure</title><source>esp@cenet</source><creator>SCHWAIGER, JURGEN ; SPITZER, ROBERT ; SCHUTTING, GUNTER ; PACHER, GERNOT ; TITJUNG, FLORIAN ; GRUBER, IRENE</creator><creatorcontrib>SCHWAIGER, JURGEN ; SPITZER, ROBERT ; SCHUTTING, GUNTER ; PACHER, GERNOT ; TITJUNG, FLORIAN ; GRUBER, IRENE</creatorcontrib><description>Apparatus (100) for testing quality of a component carrier structure (102), wherein the apparatus (100) comprises a material removal unit (112) configured for removing material of the component carrier structure (102) for exposing a plane in an interior of the component carrier structure (102), a detection unit (162) configured for detecting component carrier structure specific data (in particular image data) of the exposed plane of the component carrier structure (102), a determining unit (114) configured for determining at least one pre-defined test target (116) of the component carrier structure (102) at the exposed plane based on the component carrier structure specific data, and an evaluation unit (118) configured for identifying and evaluating at least one defect of the at least one determined test target (116) for assessing quality of the component carrier structure (102).</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220816&amp;DB=EPODOC&amp;CC=TW&amp;NR=202232118A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220816&amp;DB=EPODOC&amp;CC=TW&amp;NR=202232118A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SCHWAIGER, JURGEN</creatorcontrib><creatorcontrib>SPITZER, ROBERT</creatorcontrib><creatorcontrib>SCHUTTING, GUNTER</creatorcontrib><creatorcontrib>PACHER, GERNOT</creatorcontrib><creatorcontrib>TITJUNG, FLORIAN</creatorcontrib><creatorcontrib>GRUBER, IRENE</creatorcontrib><title>Test target defect identification and evaluation for assessing quality of component carrier structure</title><description>Apparatus (100) for testing quality of a component carrier structure (102), wherein the apparatus (100) comprises a material removal unit (112) configured for removing material of the component carrier structure (102) for exposing a plane in an interior of the component carrier structure (102), a detection unit (162) configured for detecting component carrier structure specific data (in particular image data) of the exposed plane of the component carrier structure (102), a determining unit (114) configured for determining at least one pre-defined test target (116) of the component carrier structure (102) at the exposed plane based on the component carrier structure specific data, and an evaluation unit (118) configured for identifying and evaluating at least one defect of the at least one determined test target (116) for assessing quality of the component carrier structure (102).</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi0EKwjAQRbtxIeodxgMINt24FVE8QMFlGdKfMlCTmJkI3l5BD-Dq8eC9ZYMeamRcJhiNCPBGMiKaBPFskiJxHAlPnutXQyrEqlCVONGj8iz2ohTIp3tO8bOS51IEhdRK9VYL1s0i8KzY_Lhqtpdzf7rukNMAzewRYUN_c3vnOte2h2P3T_MGollAUg</recordid><startdate>20220816</startdate><enddate>20220816</enddate><creator>SCHWAIGER, JURGEN</creator><creator>SPITZER, ROBERT</creator><creator>SCHUTTING, GUNTER</creator><creator>PACHER, GERNOT</creator><creator>TITJUNG, FLORIAN</creator><creator>GRUBER, IRENE</creator><scope>EVB</scope></search><sort><creationdate>20220816</creationdate><title>Test target defect identification and evaluation for assessing quality of component carrier structure</title><author>SCHWAIGER, JURGEN ; SPITZER, ROBERT ; SCHUTTING, GUNTER ; PACHER, GERNOT ; TITJUNG, FLORIAN ; GRUBER, IRENE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW202232118A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SCHWAIGER, JURGEN</creatorcontrib><creatorcontrib>SPITZER, ROBERT</creatorcontrib><creatorcontrib>SCHUTTING, GUNTER</creatorcontrib><creatorcontrib>PACHER, GERNOT</creatorcontrib><creatorcontrib>TITJUNG, FLORIAN</creatorcontrib><creatorcontrib>GRUBER, IRENE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SCHWAIGER, JURGEN</au><au>SPITZER, ROBERT</au><au>SCHUTTING, GUNTER</au><au>PACHER, GERNOT</au><au>TITJUNG, FLORIAN</au><au>GRUBER, IRENE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test target defect identification and evaluation for assessing quality of component carrier structure</title><date>2022-08-16</date><risdate>2022</risdate><abstract>Apparatus (100) for testing quality of a component carrier structure (102), wherein the apparatus (100) comprises a material removal unit (112) configured for removing material of the component carrier structure (102) for exposing a plane in an interior of the component carrier structure (102), a detection unit (162) configured for detecting component carrier structure specific data (in particular image data) of the exposed plane of the component carrier structure (102), a determining unit (114) configured for determining at least one pre-defined test target (116) of the component carrier structure (102) at the exposed plane based on the component carrier structure specific data, and an evaluation unit (118) configured for identifying and evaluating at least one defect of the at least one determined test target (116) for assessing quality of the component carrier structure (102).</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_TW202232118A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Test target defect identification and evaluation for assessing quality of component carrier structure
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-16T08%3A11%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SCHWAIGER,%20JURGEN&rft.date=2022-08-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW202232118A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true