Microcontroller, testing method for microcontroller and system including microcontroller

Microcontroller, testing method for microcontroller and system including microcontroller

A test method for a microcontroller is provided. The test method includes: setting a test condition and a watchpoint via an external debugger tool by a user, wherein the watchpoint points to a memory of the microcontroller; determining whether the data in the memory meets the test condition by a con...

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Hauptverfasser: CHIU, TAIN, TU, CHIEH-SHENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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TU, CHIEH-SHENG
description A test method for a microcontroller is provided. The test method includes: setting a test condition and a watchpoint via an external debugger tool by a user, wherein the watchpoint points to a memory of the microcontroller; determining whether the data in the memory meets the test condition by a control circuit of the microcontroller; and controlling the microcontroller to output a trigger signal by the control circuit when the data in the memory meets the test condition, wherein the trigger signal is used to trigger an external measuring instrument. In addition, a microcontroller and a system including the microcontroller are provided.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Microcontroller, testing method for microcontroller and system including microcontroller
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