Microcontroller, testing method for microcontroller and system including microcontroller
A test method for a microcontroller is provided. The test method includes: setting a test condition and a watchpoint via an external debugger tool by a user, wherein the watchpoint points to a memory of the microcontroller; determining whether the data in the memory meets the test condition by a con...
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | A test method for a microcontroller is provided. The test method includes: setting a test condition and a watchpoint via an external debugger tool by a user, wherein the watchpoint points to a memory of the microcontroller; determining whether the data in the memory meets the test condition by a control circuit of the microcontroller; and controlling the microcontroller to output a trigger signal by the control circuit when the data in the memory meets the test condition, wherein the trigger signal is used to trigger an external measuring instrument. In addition, a microcontroller and a system including the microcontroller are provided. |
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