Computation apparatus and method of detecting defects for near-eye display

A defect detection method for a near-eye display is provided. The near-eye display includes a display panel and a Fresnel lens. The method includes the following steps: obtaining a reference image and a to-be-tested image according to a first image and a second image of a test pattern image and a test background image displayed by the display panel captured by a camera; performing fast Fourier transform on the reference image and the to-be-tested image to obtain a frequency-domain reference image and a frequency-domain to-be-tested image; calculating an average value of pixel values above a predetermined cut-off ratio in a histogram of each first region of interest (ROI) in a filtered frequency-domain reference image as a corresponding threshold, comparing each pixel in the filtered to-be-tested image with the corresponding threshold to generate a determination result; and building a defect-status map of the near-eye display according to the determination results.