Artificial intelligence defect image classification method and system thereof

Artificial intelligence defect image classification method and system thereof

An artificial intelligence defect image classification method and a system are provide. The method includes: transferring a MEMS microphone product to a specific location by a transfer unit; positioning the MEMS microphone product by a positioning unit; scanning the MEMS microphone product to captur...

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Bibliographische Detailangaben
Hauptverfasser: LUO, ANUN, LU, CHING-LUNG, SHEN, CHIH-MING, LIANG, MING-KAAN, DAI, MING-JI, SHEN, CHING-SHIANG, YANG, HUNG-YU, DENG, YU-SHAN, CHUANG, YAIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DEAF-AID SETS
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKEACOUSTIC ELECTROMECHANICAL TRANSDUCERS
MEASURING
PHYSICS
PUBLIC ADDRESS SYSTEMS
TESTING
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Beschreibung
Zusammenfassung:An artificial intelligence defect image classification method and a system are provide. The method includes: transferring a MEMS microphone product to a specific location by a transfer unit; positioning the MEMS microphone product by a positioning unit; scanning the MEMS microphone product to capture a test image by a first image capturing device; comparing the test image to a plurality of reference images, and determining a defect classification of the test image based on a comparison result; marking a defect area on the test image based on the comparison result; and classifying and storing the MEMS microphone product based on the defect classification.