A method for detecting optical-electro characteristics of a flexible optoelectronic device
The invention provides a method for detecting optical-electro characteristics of a flexible optoelectronic device. This method is mainly implemented through a human-machine interface. A measurement parameter combination including a power measurement setting and an optical measurement setting is gene...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a method for detecting optical-electro characteristics of a flexible optoelectronic device. This method is mainly implemented through a human-machine interface. A measurement parameter combination including a power measurement setting and an optical measurement setting is generated through an input operation from the human-machine interface. According to the operation input, a platform control signal is transmitted to cause a measurement platform to drive the flexible optoelectronic device to be tested to undergo a type change between the rolled state and the unfolded state. When the flexible optoelectronic device undergoes a change in shape, multiple measurement results obtained by the electricity measuring unit and the light measuring unit are returned to the human-machine interface. Simultaneously, the man-machine interface can display multiple measurement results in real time, and judge multiple measurement results according to preset conditions. In this way, the electrical performa |
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