A patterning device

A patterning device configured for use in a lithographic apparatus, the lithographic apparatus being configured to use radiation for imaging a pattern at the patterning device via projection optics onto a substrate. The patterning device comprising a first component for reflecting and/or transmittin...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TIMMERMANS, FRANK JAN, VAN LARE, MARIE-CLAIRE
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A patterning device configured for use in a lithographic apparatus, the lithographic apparatus being configured to use radiation for imaging a pattern at the patterning device via projection optics onto a substrate. The patterning device comprising a first component for reflecting and/or transmitting the radiation, and a second component covering at least a portion of a surface of the first component and configured to at least partially absorb the radiation incident on the second component. The second component comprises a sidewall, wherein at least one part of the sidewall extends away from the first component at an angle, the angle being with respect to a plane parallel to the surface of the first component, and wherein the angle is less than 85 degrees.