Integrated laser voltage probe pad for measuring DC or low frequency AC electrical parameters with laser based optical probing techniques

A semiconductor or integrated circuit block including a sense node and a converter circuit, in which the sense node develops a low frequency electrical parameter that is constant or varies at a frequency below a predetermined frequency level, and in which the converter circuit converts the low frequ...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KERVER, HARRY BERNARDUS ANTONIUS, NIEROP, PIETER GUSTAAF, BOON, GERBEN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!