Method of manufacturing semiconductor device and system for manufacturing semiconductor device

A method of manufacturing a semiconductor device includes, for a layout diagram stored on a non-transitory computer-readable medium, generating the layout diagram including: selecting a candidate pattern in the layout diagram, the candidate pattern being a first conductive pattern in the M_2nd level...

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Bibliographische Detailangaben
Hauptverfasser: PENG, SHIH-WEI, LIN, WEING, YANG, TENGIEH, TZENG, JIANN-TYNG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A method of manufacturing a semiconductor device includes, for a layout diagram stored on a non-transitory computer-readable medium, generating the layout diagram including: selecting a candidate pattern in the layout diagram, the candidate pattern being a first conductive pattern in the M_2nd level (first M_2nd pattern) or a first conductive pattern in the M_1st level (first M_1st pattern); determining that the candidate pattern satisfies one or more criteria; and changing a size of the candidate pattern thereby revising the layout diagram. A system for manufacturing a semiconductor device is disclosed herein.