Clipped testing device

The invention discloses a clipped testing device. The clipped testing device has a first holding member and a second holding member. The first holding member has a plurality of conducting members. A first surface, a first end, and a second end are defined at the first holding member. A third end and a fourth end are defined at the second holding member. A first distance is between the first end and the third end, and the second end and the fourth end are connected. The first surface faces the second holding member. Wherein each of the conducting members has a first arm and a first bended portion. The first bended portion is connected to the first arm. The first arm is extended from the first surface, and the first bended portion, having a first angle, is bended toward the first surface.