Fracture test device and debris recovery method wherein the fracture test device is used for analyzing the properties of the chip when the chip is destroyed, and the debris recovery method is used for recovering broken chip debris

The present invention provides a fracture test device and a debris recovery method to recover broken chip debris. A fracture test device of chip comprises a chip destruction unit capable of destroying the chip, and a debris recovery unit arranged under the chip destruction unit and having a debris retaining face on its surface, wherein the debris retaining face holds debris of the chip destroyed by the chip destruction unit, and the chip destruction unit destroys the chip in such a manner that the destruction starting point of the destroyed chip faces the debris retaining face of the debris recovery unit. The debris retaining face of the debris recovery unit can be arranged along a horizontal plane. Further, the chip destruction unit has a chip clamping unit having a first chip support part and a second chip support part for holding a U-shaped curved chip, wherein the first chip support part has a first surface along the vertical direction and the second chip support part has a second surface facing along the