Test system, test method for the test system, and test carrier
A test system, a test method for the test system, and a test carrier are provided. The test system includes a power supply circuit, a control terminal circuit, and a controller. The controller is used to control the power supply circuit and the control terminal circuit to test a plurality of test it...
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| Hauptverfasser: | , , |
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | A test system, a test method for the test system, and a test carrier are provided. The test system includes a power supply circuit, a control terminal circuit, and a controller. The controller is used to control the power supply circuit and the control terminal circuit to test a plurality of test items of the power module. The power supply circuit provides a plurality of power paths corresponding to a plurality of test items in response of controlling of the controller. The control terminal circuit provides a plurality of control paths corresponding to the plurality of test items in response of controlling of the controller. Thereby test schedule of the power module is shorten. |
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