Non-contact multispectral measurement device with improved multispectral sensor

A multispectral measurement system for measuring reflectance properties of a surface of interest, comprising a multi spectral detector configured to measure spectral information in a plurality of bands of optical radiation, each band of optical radiation corresponding to a filter function, the multispectral detector comprising a plurality of photodiodes, each photodiode having a filter corresponding to one of the filter functions, there being at least two photodiodes corresponding each of the filter functions located in a point-symmetric arrangement in a two dimensional array; and observation optics having an aperture and being configured to observe the surface of interest; wherein each of the plurality of photodiodes is located in a different location with respect to the aperture, and wherein differences in a field of view of the surface of interest for each photodiode are compensated for by combining measurements of point-symmetric photodiodes.