Negative photosensitive resin composition and method for producing cured relief pattern capable of obtaining a relatively high imidization rate and chemical resistance in low-temperature curing

The present invention provides a negative photosensitive resin composition capable of obtaining a relatively high imidization rate and chemical resistance in low-temperature curing, exhibiting a relatively high copper adhesion, and releasing less gas in a heating step after thermal curing, and also...

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Hauptverfasser: SHIOSAKI, SHUJIRO, OGURA, TOMOHITO
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The present invention provides a negative photosensitive resin composition capable of obtaining a relatively high imidization rate and chemical resistance in low-temperature curing, exhibiting a relatively high copper adhesion, and releasing less gas in a heating step after thermal curing, and also provides a method for producing a cured relief pattern by using the negative photosensitive resin composition. The negative photosensitive resin composition of the present invention includes (A) a polyimide precursor, (B) an imide compound represented by the following general formula (1), and (C) a photo-polymerization initiator. In the formula (1), A1 is a group selected from the group consisting of a hydrogen atom, a hydroxyl group, and an amino group, and A2 is a divalent organic group having 1 to 20 carbon atoms.