Multi-directional self-aligned multiple patterning

Interconnect structures and methods of fabricating an interconnect structure. First and second non-mandrel interconnects are formed in an interlayer dielectric layer. The first non-mandrel interconnect and the second non-mandrel interconnect have respective side surfaces that extend in a first direc...

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Bibliographische Detailangaben
Hauptverfasser: BOMBARDIER, COLIN, KM MAHALINGAM, ANBU SELVAM, CHAUHAN, VIKRANT, HE, MING, DONEGAN, KEITH
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:Interconnect structures and methods of fabricating an interconnect structure. First and second non-mandrel interconnects are formed in an interlayer dielectric layer. The first non-mandrel interconnect and the second non-mandrel interconnect have respective side surfaces that extend in a first direction. The connector interconnect extends in a second direction transverse to the first direction from the side surface of the first non-mandrel interconnect to the side surface of the second non-mandrel interconnect.