Wear-out monitor device

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indic...

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Bibliographische Detailangaben
Hauptverfasser:	O'DONNELL, ALAN J, MANNING, KEVIN B, CLARKE, DAVID J, BOLAND, DAVID, COYNE, EDWARD JOHN, O'DWYER, THOMAS G, BRADLEY, SHAUN, HEFFERNAN, COLM PATRICK, LOOBY, MICHAEL A, AHERNE, DAVID, FORDE, MARK
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.