Method for manufacturing semiconductor device

A method includes depositing an ESL on a substrate; patterning the ESL such that a first region of the substrate is covered thereby and a second region of the substrate is exposed within an opening of the etch stop layer; depositing a first dielectric layer on the ESL in the first region and on the substrate in the second region; patterning the first dielectric layer to form a first trench through the first dielectric layer in the first region; forming a metal feature in the first trench; depositing a second dielectric layer over the metal feature in the first region and over the first dielectric layer in the second region; and performing a patterning process to form a second trench through the second dielectric layer in the first region, and to form a third trench through the second and first dielectric layers in the second region.