Method of inspecting organic electronic device, method of analyzing the same, and use of the same

Provided is an inspection method for non-destructively detecting the location of an abnormality generated by electrical operation of an organic electronic device. The inspection method pertaining to the present invention includes a detection step for detecting the location of an abnormality generate...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	IMANISHI, KATSUYA, OHMORI, MIHO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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