Method of inspecting organic electronic device, method of analyzing the same, and use of the same
Provided is an inspection method for non-destructively detecting the location of an abnormality generated by electrical operation of an organic electronic device. The inspection method pertaining to the present invention includes a detection step for detecting the location of an abnormality generate...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | Provided is an inspection method for non-destructively detecting the location of an abnormality generated by electrical operation of an organic electronic device. The inspection method pertaining to the present invention includes a detection step for detecting the location of an abnormality generated by electrical operation of an organic electronic device by evaluating, using an optical method, a defect in the organic electronic device in a state in which electrical operation is not performed. |
|---|