Insert for test handler preventing the supportive member from being pressed by the pushed flexible materials of the testing socket

Disclosed is an insert for test handler, which includes: a supportive member for supporting a semiconductor component inserted into a hole from one side of the hole; a fixing member for fixing the supportive member to a main body; and a latching device for holding the semiconductor component in the hole. Wherein the supportive member is formed with a plurality of opening holes that are used to enable terminals of the semiconductor member to face towards the testing machine in an opening manner, thereby enabling the terminals of the semiconductor member supported by the supportive member to be electrically connected to a test socket on the testing machine, in addition, the supportive member is provided with a receiving space on a surface opposite to the test socket, in which the receiving space is capable of receiving pushed flexible materials while the terminals of the semiconductor component contact the test socket. The disclosed is able to prevent the supportive member from being pressed by the pushed flexi